4H-N 4H-SEMI 2inch 3inch 4inch 6Inch SiC Substrate Production grade dummy grade for High-Power Devices
H High Purity Silicon Carbide Substrates,high purity 4inch SiC substrates ,4inch Silicon Carbide substrates for semiconductor, Silicon Carbide substrates for semconductor ,sic single crystal wafers ,sic ingots for gem
Application areas
1 high frequency and high power electronic devices Schottky diodes, JFET, BJT, PiN, diodes, IGBT, MOSFET
2 optoelectronic devices: mainly used in GaN/SiC blue LED substrate material (GaN/SiC) LED
advantagement
• Low lattice mismatch
• High thermal conductivity
• Low power consumption
• Excellent transient characteristics
• High band gap
Silicon Carbide SiC crystal substrate wafer carborundum
SILICON CARBIDE MATERIAL PROPERTIES
Property | 4H-SiC, Single Crystal | 6H-SiC, Single Crystal |
Lattice Parameters | a=3.076 Å c=10.053 Å | a=3.073 Å c=15.117 Å |
Stacking Sequence | ABCB | ABCACB |
Mohs Hardness | ≈9.2 | ≈9.2 |
Density | 3.21 g/cm3 | 3.21 g/cm3 |
Therm. Expansion Coefficient | 4-5×10-6/K | 4-5×10-6/K |
Refraction Index @750nm |
no = 2.61 ne = 2.66 |
no = 2.60 ne = 2.65 |
Dielectric Constant | c~9.66 | c~9.66 |
Thermal Conductivity (N-type, 0.02 ohm.cm) |
a~4.2 W/cm·K@298K c~3.7 W/cm·K@298K |
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Thermal Conductivity (Semi-insulating) |
a~4.9 W/cm·K@298K c~3.9 W/cm·K@298K |
a~4.6 W/cm·K@298K c~3.2 W/cm·K@298K |
Band-gap | 3.23 eV | 3.02 eV |
Break-Down Electrical Field | 3-5×106V/cm | 3-5×106V/cm |
Saturation Drift Velocity | 2.0×105m/s | 2.0×105m/s |
2. substrates size of standard for 6inch
6 inch Diameter 4H-N &Semi Silicon Carbide Substrate Specifications | ||||||||
SUBSTRATE PROPERTY | Zero Grade | Production Grade | Research Grade | Dummy Grade | ||||
Diameter | 150 mm-0.05 mm | |||||||
Surface Orientation | off-axis: 4°toward <11-20> ± 0.5° for 4H-N
On axis: <0001>±0.5°for 4H-SI |
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Primary Flat Orientation |
{10-10} ±5.0° for 4H-N/ Notch for 4H-Semi |
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Primary Flat Length | 47.5 mm ± 2.5 mm | |||||||
Thickness 4H-N | STD 350±25um or customzied 500±25um | |||||||
Thickness 4H-SEMI | 500±25um STD | |||||||
Wafer Edge | Chamfer | |||||||
Micropipe Density For 4H-N | <0.5 micropipes/ cm2 | ≤2micropipes/ cm2 | ≤10 micropipes/ cm2 |
≤15 micropipes/ cm2
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Micropipe Density For 4H-SEMI | <1 micropipes/ cm2 | ≤5micropipes/ cm2 | ≤10 micropipes/ cm2 | ≤20 micropipes/ cm2 | ||||
Polytype areas by high-intensity light | None permitted | ≤10% area | ||||||
Resistivity for 4H-N | 0.015 Ω·cm~0.028 Ω·cm | (area 75%)0.015Ω·cm~0.028 Ω·cm | ||||||
Resistivity for 4H-SEMI |
≥1E9 Ω·cm |
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LTV/TTV/BOW/WARP |
≤3 μm/≤6 μm/≤30 μm/≤40 μm |
≤5 μm/≤15 μm/≤40 μm/≤60 μm |
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Hex Plates By High Intensity Ligh |
Cumulative area ≤0.05% |
Cumulative area ≤0.1% |
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Silicon Surface Contamination by High Intensity Light |
NONE |
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Visual Carbon Inclusions
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Cumulative area ≤0.05% |
Cumulative area ≤3% |
Polytype Areas By High Intensity Light
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NONE |
Cumulative area≤3% |
Delivery Sample
The Other Services we can provide
1.Customized thickness wire-cut 2. customized size chip slice 3. cuotomized shape lens
The Other Similar Products we can provide
FAQ:
Q: What's the wayof shipping and cost and pay term ?
A:(1) We accept 50% T/T In advance and left 50% before delivery by DHL, Fedex, EMS etc.
(2) If you have your own express account, it's great.If not,we could help you ship them.
Freight is in accordance with the actual settlement.
Q: What's your MOQ?
A: (1) For inventory, the MOQ is 3pcs.
(2) For customized products, the MOQ is 10pcs up.
Q: Can I customize the products based on my need?
A: Yes, we can customize the material, specifications and shape, size based on your needs.
Q: What's the delivery time?
A: (1) For the standard products
For inventory: the delivery is 5 workdays after you place the order.
For customized products: the delivery is 2 or 3 weeks after you place the order.
(2) For the special-shaped products, the delivery is 4 workweeks after you place the order.
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